Proceedings Articles |
| 16. | Zhu M, Wilson R, Dizon-Paradis R N, Dizon-Paradis O P, Forte D J, Woodard D L: Genetic Algorithm-Assisted Golden-Free Standard Cell Library Extraction from SEM Images. In: 2025 26th International Symposium on Quality Electronic Design (ISQED), pp. 1–8, International Symposium on Quality Electronic Design (ISQED) IEEE, 2025, (Accepted). @inproceedings{zhu2025genetic,
title = {Genetic Algorithm-Assisted Golden-Free Standard Cell Library Extraction from SEM Images},
author = {Mengdi Zhu and Ronald Wilson and Reiner N. Dizon-Paradis and Olivia P. Dizon-Paradis and Domenic J. Forte and Damon L. Woodard},
url = {http://dx.doi.org/10.1109/ISQED65160.2025.11014403},
doi = {10.1109/isqed65160.2025.11014403},
year = {2025},
date = {2025-04-01},
urldate = {2025-01-01},
booktitle = {2025 26th International Symposium on Quality Electronic Design (ISQED)},
pages = {1–8},
publisher = {IEEE},
organization = {International Symposium on Quality Electronic Design (ISQED)},
note = {Accepted},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 15. | Wu J, Dizon-Paradis O, Rahman S, Woodard D, Forte D: DOSCrack: Deobfuscation Using Oracle-Guided Symbolic Execution and Clustering of Binary Security Keys. In: 2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 227–232, IEEE, 2024. @inproceedings{wu2024doscrack,
title = {DOSCrack: Deobfuscation Using Oracle-Guided Symbolic Execution and Clustering of Binary Security Keys},
author = {Jiaming Wu and Olivia Dizon-Paradis and Sazadur Rahman and Damon Woodard and Domenic Forte},
url = {http://dx.doi.org/10.1109/host55342.2024.10545388},
doi = {10.1109/host55342.2024.10545388},
year = {2024},
date = {2024-05-01},
booktitle = {2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
pages = {227–232},
publisher = {IEEE},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 14. | Jessurun N, Capecci D, Dizon-Paradis O, Woodard D, Asadizanjani N: Semi-Supervised Semantic Annotator (S3A): Toward Efficient Semantic Labeling. In: Proceedings of the 21st Python in Science Conference, pp. 7–12, SciPy, 2022, ISSN: 2575-9752. @inproceedings{jessurun2022semi,
title = {Semi-Supervised Semantic Annotator (S3A): Toward Efficient Semantic Labeling},
author = {Nathan Jessurun and Daniel Capecci and Olivia Dizon-Paradis and Damon Woodard and Navid Asadizanjani},
url = {http://dx.doi.org/10.25080/majora-212e5952-001},
doi = {10.25080/majora-212e5952-001},
issn = {2575-9752},
year = {2022},
date = {2022-01-01},
booktitle = {Proceedings of the 21st Python in Science Conference},
pages = {7–12},
publisher = {SciPy},
series = {SciPy},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 13. | Pasunuri A, Jessurun N, Dizon-Paradis O P, Asadizanjani N: A Comparison of Neural Networks for PCB Component Segmentation. In: 2021 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 113–123, IEEE, 2021. @inproceedings{pasunuri2021comparison,
title = {A Comparison of Neural Networks for PCB Component Segmentation},
author = {Abinai Pasunuri and Nathan Jessurun and Olivia P. Dizon-Paradis and Navid Asadizanjani},
url = {http://dx.doi.org/10.1109/host49136.2021.9702286},
doi = {10.1109/host49136.2021.9702286},
year = {2021},
date = {2021-12-01},
booktitle = {2021 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
pages = {113–123},
publisher = {IEEE},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 12. | Sathiaseelan M A M, Paradis O P, Rai R, Pandurangi S V, Vutukuru M Y, Taheri S, Asadizanjani N: Logo Classification and Data Augmentation Techniques for PCB Assurance and Counterfeit Detection. In: ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, pp. 12–19, ASM International, 2021, ISSN: 0890-1740. @inproceedings{sathiaseelan2021logo,
title = {Logo Classification and Data Augmentation Techniques for PCB Assurance and Counterfeit Detection},
author = {Mukhil Azhagan Mallaiyan Sathiaseelan and Olivia P. Paradis and Rajat Rai and Suryaprakash Vasudev Pandurangi and Manoj Yasaswi Vutukuru and Shayan Taheri and Navid Asadizanjani},
url = {http://dx.doi.org/10.31399/asm.cp.istfa2021p0012},
doi = {10.31399/asm.cp.istfa2021p0012},
issn = {0890-1740},
year = {2021},
date = {2021-10-01},
booktitle = {ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis},
volume = {84215},
pages = {12–19},
publisher = {ASM International},
series = {ISTFA2021},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 11. | Dizon-Paradis O P, Capecci D E, Jessurun N T, Woodard D L, Tehranipoor M M, Asadizanjani N: Framework for Automatic PCB Marking Detection and Recognition for Hardware Assurance. In: Government Microcircuit Applications and Critical Technology Conference (GOMACTech), 2021. @inproceedings{paradis2021framework,
title = {Framework for Automatic PCB Marking Detection and Recognition for Hardware Assurance},
author = {Olivia P. Dizon-Paradis and Daniel E. Capecci and Nathan T. Jessurun and Damon L. Woodard and Mark M. Tehranipoor and Navid Asadizanjani},
url = {https://arxiv.org/abs/2307.13105},
doi = {10.48550/ARXIV.2307.13105},
year = {2021},
date = {2021-01-01},
booktitle = {Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 10. | Jessurun N T, Dizon-Paradis O P, Tehranipoor M, Asadizanjani N: SHADE: Automated Refinement of PCB Component Estimates Using Detected Shadows. In: 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), pp. 1–6, IEEE, 2020. @inproceedings{jessurun2020shade,
title = {SHADE: Automated Refinement of PCB Component Estimates Using Detected Shadows},
author = {Nathan T. Jessurun and Olivia P. Dizon-Paradis and Mark Tehranipoor and Navid Asadizanjani},
url = {http://dx.doi.org/10.1109/paine49178.2020.9337564},
doi = {10.1109/paine49178.2020.9337564},
year = {2020},
date = {2020-12-01},
booktitle = {2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)},
pages = {1–6},
publisher = {IEEE},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 9. | Paradis O P, Jessurun N T, Tehranipoor M, Asadizanjani N: Color Normalization for Robust Automatic Bill of Materials Generation and Visual Inspection of PCBs. In: ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis, pp. 172–179, ASM International, 2020, ISSN: 0890-1740. @inproceedings{paradis2020color,
title = {Color Normalization for Robust Automatic Bill of Materials Generation and Visual Inspection of PCBs},
author = {Olivia P. Paradis and Nathan T. Jessurun and Mark Tehranipoor and Navid Asadizanjani},
url = {http://dx.doi.org/10.31399/asm.cp.istfa2020p0172},
doi = {10.31399/asm.cp.istfa2020p0172},
issn = {0890-1740},
year = {2020},
date = {2020-12-01},
booktitle = {ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis},
volume = {83348},
pages = {172–179},
publisher = {ASM International},
series = {ISTFA2020},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 8. | Dizon-Paradis O P, Varshney N, Rahman M T, Strizich M, Shen H, Asadizanjani N: In-Situ Thickness Measurement of Die Silicon Using Voltage Imaging for Hardware Assurance. In: Government Microcircuit Applications and Critical Technology Conference (GOMACTech), 2020. @inproceedings{paradis2020in,
title = {In-Situ Thickness Measurement of Die Silicon Using Voltage Imaging for Hardware Assurance},
author = {Olivia P. Dizon-Paradis and Nitin Varshney and M Tanjidur Rahman and Michael Strizich and Haoting Shen and Navid Asadizanjani},
url = {https://arxiv.org/abs/2307.13118},
doi = {10.48550/ARXIV.2307.13118},
year = {2020},
date = {2020-01-01},
booktitle = {Government Microcircuit Applications and Critical Technology Conference (GOMACTech)},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
| 7. | Vashistha N, Rahman M T, Dizon-Paradis O P, Asadizanjani N: Is Backside the New Backdoor in Modern SoCs?: Invited Paper. In: 2019 IEEE International Test Conference (ITC), pp. 1–10, IEEE, 2019. @inproceedings{vashistha2019backside,
title = {Is Backside the New Backdoor in Modern SoCs?: Invited Paper},
author = {Nidish Vashistha and M Tanjidur Rahman and Olivia P. Dizon-Paradis and Navid Asadizanjani},
url = {http://dx.doi.org/10.1109/itc44170.2019.9000127},
doi = {10.1109/itc44170.2019.9000127},
year = {2019},
date = {2019-11-01},
booktitle = {2019 IEEE International Test Conference (ITC)},
pages = {1–10},
publisher = {IEEE},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
|
Patents |
| 6. | Asadizanjani N, Jessurun N T, Tehranipoor M M, Dizon-Paradis O P: Techniques for printed circuit board component detection. U.S. Patent App. No. 17/168,529, 2021, (U.S. Patent No. 11,520,967, issued Dec. 2022). @patent{asadi2021techniques,
title = {Techniques for printed circuit board component detection},
author = {Navid Asadizanjani and Nathan T. Jessurun and Mark M. Tehranipoor and Olivia P. Dizon-Paradis},
url = {https://patents.google.com/patent/US11520967B2/en},
year = {2021},
date = {2021-02-05},
number = {U.S. Patent App. No. 17/168,529},
note = {U.S. Patent No. 11,520,967, issued Dec. 2022},
keywords = {},
pubstate = {published},
tppubtype = {patent}
}
|
| 5. | Tehranipoor M M, Asadizanjani N, Dizon-Paradis O P, Varshney N: Hardware deprocessing using voltage imaging for hardware assurance. U.S. Patent App. No. 17/167,381, 2021, (U.S. Patent No. 11,604,912, issued Mar. 2023). @patent{tehranipoor2021hardware,
title = {Hardware deprocessing using voltage imaging for hardware assurance},
author = {Mark M. Tehranipoor and Navid Asadizanjani and Olivia P. Dizon-Paradis and Nitin Varshney},
url = {https://patents.google.com/patent/US20210264082A1/en},
year = {2021},
date = {2021-02-04},
number = {U.S. Patent App. No. 17/167,381},
note = {U.S. Patent No. 11,604,912, issued Mar. 2023},
keywords = {},
pubstate = {published},
tppubtype = {patent}
}
|
PhD Theses |
| 4. | Dizon-Paradis O P: Framework for Applying Imitation Learning Methods on Reinforcement Learning Demonstrations. University of Florida, 2024, (Embargoed access). @phdthesis{dizon2024framework,
title = {Framework for Applying Imitation Learning Methods on Reinforcement Learning Demonstrations},
author = {Olivia P. Dizon-Paradis},
year = {2024},
date = {2024-08-01},
urldate = {2024-08-01},
publisher = {University of Florida},
school = {University of Florida},
note = {Embargoed access},
keywords = {},
pubstate = {published},
tppubtype = {phdthesis}
}
|
Unpublished |
| 3. | Dizon-Paradis O P, Wormald S E, Zhu M, Wilson R, Woodard D L: LfRLD: Learning From Reinforcement Learning Demonstrations. 2024, (CC BY-NC-SA 4.0 License). @unpublished{dizon2024lfrld,
title = {LfRLD: Learning From Reinforcement Learning Demonstrations},
author = {Olivia P. Dizon-Paradis and Stephen E. Wormald and Mengdi Zhu and Ronald Wilson and Damon L. Woodard},
url = {http://dx.doi.org/10.36227/techrxiv.172927301.18452996/v1},
doi = {10.36227/techrxiv.172927301.18452996/v1},
year = {2024},
date = {2024-10-01},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
note = {CC BY-NC-SA 4.0 License},
keywords = {},
pubstate = {published},
tppubtype = {unpublished}
}
|
| 2. | Mehta D, True J, Dizon-Paradis O P, Jessurun N T, Woodard D L, Asadizanjani N, Tehranipoor M M: FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection. Cryptology ePrint Archive, Paper 2022/924, 2022, (CC BY 4.0 License). @unpublished{mehta2022fics,
title = {FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection},
author = {Dhwani Mehta and John True and Olivia P. Dizon-Paradis and Nathan T. Jessurun and Damon L. Woodard and Navid Asadizanjani and Mark M. Tehranipoor},
url = {https://eprint.iacr.org/2022/924},
year = {2022},
date = {2022-01-01},
howpublished = {Cryptology ePrint Archive, Paper 2022/924},
note = {CC BY 4.0 License},
keywords = {},
pubstate = {published},
tppubtype = {unpublished}
}
|
| 1. | Lu H, Mehta D, Dizon-Paradis O P, Asadizanjani N, Tehranipoor M M, Woodard D L: FICS-PCB: A Multi-Modal Image Dataset for Automated Printed Circuit Board Visual Inspection. Cryptology ePrint Archive, Paper 2020/366, 2020, (CC BY 4.0 License). @unpublished{lu2020fics,
title = {FICS-PCB: A Multi-Modal Image Dataset for Automated Printed Circuit Board Visual Inspection},
author = {Hangwei Lu and Dhwani Mehta and Olivia P. Dizon-Paradis and Navid Asadizanjani and Mark M. Tehranipoor and Damon L. Woodard},
url = {https://eprint.iacr.org/2020/366},
year = {2020},
date = {2020-01-01},
howpublished = {Cryptology ePrint Archive, Paper 2020/366},
note = {CC BY 4.0 License},
keywords = {},
pubstate = {published},
tppubtype = {unpublished}
}
|