Research

You can find all of my publications on Google Scholar.

NOTE: This directory may contain links, text, or other content from articles that may be covered by copyright. You may browse the articles at your convenience, in the same spirit as you may read a journal or a proceedings article in a public library. Retrieving, copying, or distributing these files may violate copyright protection laws.
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Journal Articles

36. McLoon C, Wormald S E, Dizon-Paradis O P, Woodard D L: A Performance Comparison of Multi-Agent Reinforcement Learning Algorithms using PyMARL2. In: UF Journal of Undergraduate Research, vol. 27, 2025, ISSN: 2638-0668. (Type: Journal Article | Links | BibTeX)
35. Wu J, Dizon-Paradis O, Rahman S, Woodard D L, Forte D: Protecting Dynamically Obfuscated Scan Chain Architecture from DOSCrack with Trivium Pseudo-Random Number Generation. In: Cryptography, vol. 9, no. 1, pp. 6, 2025, ISSN: 2410-387X. (Type: Journal Article | Links | BibTeX)
34. Dizon-Paradis O P, Koblah D S, Wilson R, Forte D, Woodard D L: IC SEM Reverse Engineering Tutorial Using Artificial Intelligence. In: IEEE Design & Test, vol. 42, no. 4, pp. 59-68, 2025. (Type: Journal Article | Links | BibTeX)
33. Wormald S, Maldaner M K, O’Connor K D, Dizon-Paradis O P, Woodard D L: Abstracting general syntax for XAI after decomposing explanation sub-components. In: Artificial Intelligence Review, vol. 58, no. 8, pp. 247, 2025. (Type: Journal Article | Links | BibTeX)
32. Ghosh P, Lee G, Zhu M, Dizon-Paradis O P, Botero U J, Woodard D L, Forte D: MaGNIFIES: Manageable GAN Image Augmentation Framework for Inspection of Electronic Systems. In: Journal of Hardware and Systems Security, vol. 8, no. 1, pp. 44–59, 2024, ISSN: 2509-3436. (Type: Journal Article | Links | BibTeX)
31. Swarup A, Bhandarkar A, Dizon-Paradis O P, Wilson R, Woodard D L: Maximizing Relation Extraction Potential: A Data-Centric Study to Unveil Challenges and Opportunities. In: IEEE Access, vol. 12, pp. 167655–167682, 2024, ISSN: 2169-3536. (Type: Journal Article | Links | BibTeX)
30. Dizon-Paradis O P, Wormald S E, Capecci D E, Bhandarkar A, Woodard D L: Resource Usage Evaluation of Discrete Model-Free Deep Reinforcement Learning Algorithms. In: Reinforcement Learning Journal, vol. 5, pp. 2162–2177, 2024. (Type: Journal Article | Links | BibTeX)
29. Koblah D S, Botero U J, Costello S P, Dizon-Paradis O P, Ganji F, Woodard D L, Forte D: A Fast Object Detection-Based Framework for Via Modeling on PCB X-Ray CT Images. In: ACM Journal on Emerging Technologies in Computing Systems, vol. 19, no. 4, pp. 1–20, 2023, ISSN: 1550-4840. (Type: Journal Article | Links | BibTeX)
28. Koblah D S, Dizon-Paradis O P, Schubeck J, Botero U J, Woodard D L, Forte D: A Comprehensive Taxonomy of Visual Printed Circuit Board Defects. In: Journal of Hardware and Systems Security, vol. 7, no. 2–3, pp. 25–43, 2023, ISSN: 2509-3436. (Type: Journal Article | Links | BibTeX)
27. Jessurun N, Dizon-Paradis O P, Harrison J, Ghosh S, Tehranipoor M M, Woodard D L, Asadizanjani N: FPIC: A Novel Semantic Dataset for Optical PCB Assurance. In: ACM Journal on Emerging Technologies in Computing Systems, vol. 19, no. 2, pp. 1–21, 2023, ISSN: 1550-4840. (Type: Journal Article | Links | BibTeX)
26. Koblah D, Acharya R, Capecci D, Dizon-Paradis O, Tajik S, Ganji F, Woodard D, Forte D: A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design Automation. In: ACM Transactions on Design Automation of Electronic Systems, vol. 28, no. 2, pp. 1–57, 2023, ISSN: 1557-7309. (Type: Journal Article | Links | BibTeX)
25. Wilson R, Dizon-Paradis O P, Forte D, Woodard D L: SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits. In: IEEE Access, vol. 11, pp. 137798–137809, 2023, ISSN: 2169-3536. (Type: Journal Article | Links | BibTeX)
24. Sathiaseelan M A M, Paradis O P, Taheri S, Asadizanjani N: Why Is Deep Learning Challenging for Printed Circuit Board (PCB) Component Recognition and How Can We Address It?. In: Cryptography, vol. 5, no. 1, pp. 9, 2021, ISSN: 2410-387X. (Type: Journal Article | Links | BibTeX)
23. Mehta D, Lu H, Paradis O P, S. M A M, Rahman M T, Iskander Y, Chawla P, Woodard D L, Tehranipoor M, Asadizanjani N: The Big Hack Explained: Detection and Prevention of PCB Supply Chain Implants. In: ACM Journal on Emerging Technologies in Computing Systems, vol. 16, no. 4, pp. 1–25, 2020, ISSN: 1550-4840. (Type: Journal Article | Links | BibTeX)
22. Jessurun N, Paradis O, Roberts A, Asadizanjani N: Component Detection and Evaluation Framework (CDEF): A Semantic Annotation Tool. In: Microscopy and Microanalysis, vol. 26, no. S2, pp. 1470–1474, 2020, ISSN: 1435-8115. (Type: Journal Article | Links | BibTeX)
21. Varshney N, Shen H, Paradis O, Asadizanjani N: He-ion Beam Imaging for Accurate Hardware Trojan Detection. In: Microscopy and Microanalysis, vol. 26, no. S2, pp. 188–190, 2020, ISSN: 1435-8115. (Type: Journal Article | Links | BibTeX)

Book Chapters

20. Wilson R, Dizon-Paradis O P, Bhandarkar A, Swarup A, Capecci D E, Fu R J C, Woodard D L: AI Theories, Techniques, and Trends Shaping Business Innovation. In: Artificial Intelligence, Machine Learning, and Robotics in General Business, Chapter 9, Kendall Hunt, 1, 2025, ISBN: 9798385153398. (Type: Book Chapter | BibTeX)
19. Dizon-Paradis O P, Capecci D E, Pan T B, Fu R J C, Woodard D L: Machine Learning in Marketing Research. In: Artificial Intelligence, Machine Learning, and Robot Applications in Hospitality Businesses, Chapter 4, Kendall Hunt, 1, 2024, ISBN: 9798765783818. (Type: Book Chapter | BibTeX)
18. Wilson R, Dizon-Paradis O P, Capecci D E, Bhandarkar A, Fu R J C, Woodard D L: Methods and Theories in AI and ML Approaches. In: Artificial Intelligence, Machine Learning, and Robot Applications in Hospitality Businesses, Chapter 13, Kendall Hunt, 1, 2024, ISBN: 9798765783818. (Type: Book Chapter | BibTeX)

Proceedings Articles

17. Lee G, Bowman W, Dizon-Paradis O, Dizon-Paradis R, Wilson R, Woodard D, Forte D: Potentials and Pitfalls of Applying Federated Learning in Hardware Assurance. In: ISTFA 2025: Conference Proceedings from the 51st International Symposium for Testing and Failure Analysis, pp. 302–313, ASM International, 2025, ISSN: 0890-1740. (Type: Proceedings Article | Links | BibTeX)
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